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Study on Accelerating Voltage of SEM in Observation of Carbon Nanotube Surface

Received: 12 August 2022     Accepted: 20 October 2022     Published: 31 October 2022
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Abstract

Carbon nanotubes (CNTs) have attracted increasing attention due to their superior physical and chemical properties such as their high electrical and thermal conductivity, great specific area, etc. Scanning electron microscopy on commercial CNTs was optimized. Based of Rayleigh level, the resolution of optical system was induced by substituting parameters of thermoelectric emission scanning electron microscope. The size of interaction range of electron-CNTs is evaluated by substituting parameters of CNTs into the equation evaluating size of Kanaya-Okayama range. Based on theoretical analytical results, the high voltage range is defined in fine structure observation of CNTs surface by thermoelectric emission scanning electron microscope. We selected the spot size as 1.5nm, the working distance as 4.3mm, and did the SEM measurement experiment changing the accelerating voltage. The effects of energy of the incident electron on the size of the electron-CNTs interaction range and the resolution of SEM were theoretically investigated. As a result, in case of microstructure observation of CNTs surface by using thermoelectric SEM, the most proper accelerating voltage was within 5~10kV. Through the experiments based on it, we found that the accelerating voltage of 7.5kV enables us to get the sharpest image of the microstructure of CNT surface. Then we compared theoretical results and experimental results. Theoretical results and experimental results were agreed well.

Published in Nanoscience and Nanometrology (Volume 8, Issue 1)
DOI 10.11648/j.nsnm.20220801.12
Page(s) 10-14
Creative Commons

This is an Open Access article, distributed under the terms of the Creative Commons Attribution 4.0 International License (http://creativecommons.org/licenses/by/4.0/), which permits unrestricted use, distribution and reproduction in any medium or format, provided the original work is properly cited.

Copyright

Copyright © The Author(s), 2022. Published by Science Publishing Group

Keywords

Scanning Electron Microscopy, Carbon Nanotube, Surface, Fine Structure, Accelerating Voltage

References
[1] T. Verduin, S. R. Lokhorst, C. W. Hagen, P. Kruit Sensitivity of secondary electron yields and SEM images to scattering parameters in MC simulations Microelectronic Engineering 155 (2016) 114–117.
[2] Jinsen Tian, Jing Wu, Yu-Lung Chiu Monte Carlo simulation and theoretical calculation of SEM image intensity and its application in thickness measurement Ultramicroscopy 187 (2018) 13-19.
[3] A. V. Siklitskaya, S. G. Yastrebov, R. Smith, An interpretation of the strongest X-ray diffraction peak for various carbon nanoclusters NANOSYSTEMS: PHYSICS, CHEMISTRY, MATHEMATICS, 2016, 7 (2), P. 340–348.
[4] Y T Yue, H M Li and Z J Ding Monte Carlo simulation of secondary electron and backscattered electron images for a nanoparticle–matrix system J. Phys. D: Appl. Phys. 38 (2005) 1966–1977.
[5] P. ZHANG, H. Y. WANG, Y. G. LI, S. F. MAO, AND Z. J. DING Monte Carlo Simulation of Secondary Electron Images for Real Sample Structures in Scanning Electron Microscopy SCANNING VOL. 34, 145–150 (2012).
[6] Makoto Suzuki, Toshishige Yamada, and Cary Y. Yang Monte Carlo simulation of scanning electron microscopy bright contrast images of suspended carbon nanofibers APPLIED PHYSICS LETTERS 90, 083111 (2007).
[7] Joseph I. Goldstein, Dale E. Newbury, Patrick Echlin, David C. Joy, A. D. Romig, Jr, Charles E. Lyman, Charles Fiori, Eric LHshin Scanning Electron Microscopy and X-Ray Microanalysis SECOND EDITION PLENUM PRESS. NEW YORK AND LONDON 1992.
[8] Mitsuku Sato, An approximation method of resolution based on information-passing capacity (ICP) of an electron optical system Denver, Colorado July 1999 SPIE Vol. 3777 47-58.
[9] Wenjing Li, Wolfgang Bauhofer, Imaging of CNTs in a polymer matrix at low accelerating voltages using a SEM CARBON 49 (2011) 3891–3898.
[10] Dan Hea, Cheng Fua, Zhigang Xueb, Optimization study of direct morphology observation by cold field emission SEM without gold coating Micron 109 (2018) 53–57.
[11] Zhen Sang, Kai Ke, Ica Manas-Zloczower, Effect of carbon nanotube morphology on properties in thermoplastic elastomer composites for strain sensors Composites Part A 121 (2019) 207–212.
[12] G. H. Jayakody, T. R. C. Wells, M. M. El-Gomati, Imaging of doped Si in low and very low voltage SEM: the contrast interpretation Journal of Electron Spectroscopy and Related Phenomena 143 (2005) 233–239.
[13] Sameer F. Hamad, Nicola Stehling, C. Holland, J. P. Foreman, C. Rodenburg Low-Voltage SEM of Natural Plant Fibers: Microstructure Properties (Surface and Cross-Section) and their Link to the Tensile Properties Procedia Engineering 200 (2017) 295–302.
[14] Jingyue Liu, High-Resolution and Low-Voltage FE-SEM Imaging and Microanalysis in Materials Characterization MATERIALS CHARACTERIZATION 44: 353–363 (2000).
[15] Jatin Sethi, Essi Sarlin, Seyyed Shayan Meysami, Reija Suihkonen, Arunjunai Raja Shankar Santha Kumar, Mari Honkanen, Pasi Keinänen, Nicole Grobert, Jyrki Vuorinen, The effect of multi-wall carbon nanotube morphology on electrical and mechanical properties of polyurethane nanocomposites Composites: Part A 102 (2017) 305–313.
[16] Farhad Daneshvar, Tan Zhang, Atif Aziz, Hung-Jue Sue, Mark E., Welland Tuning the composition and morphology of carbon nanotube-copper interface Carbon 157 (2020) 583e593.
[17] Hirotaka Inoue, Masaki Hada, Tomohiro Nakagawa, Tatsuki Marui, Takeshi Nishikawa, Yoshifumi Yamashita, Yoku Inoue, Kazuhiko Takahashi, Yasuhiko Hayashi, The critical role of the forest morphology for dry drawability of few-walled carbon nanotubes Carbon 158 (2020) 662e671.
[18] Chenxiao Han, Rui Wanga, Aifei Pan, Wenjun Wang, Hongyang Huang a, Jinying Zhang, Chunming Niu, A Morphology-directing transformation of carbon nanotubes under the irradiation of pulsed laser with different pulsed duration Optics and Laser Technology 109 (2019) 27–32.
[19] Akira Endo, Mitsuhiko Yamada, Sho Kataoka, Tsuneji Sano, Yuki Inagi, Atsushi Miyaki, Direct observation of surface structure of mesoporous silica with low accelerating voltage FE-SEM Colloids and Surfaces A: Physicochemical and Engineering Aspects.
[20] Thomas E. Davies, He Li, Stéphanie Bessette, Raynald Gauvin, Gregory S. Patience, Nicholas F. Dummer, Experimental methods in chemical engineering: Scanning electron microscopy and X-ray ultra-microscopy—SEM and XuM, The Canadian Journal of Chemical Engineering, Volume 100, Issue 11, November 2022, Pages 3145-3159.
[21] Kyu-Young Park, Yizhou Zhu, Carlos G. Torres-Castanedo, Hee Joon Jung, Norman S. Luu, Ozge Kahvecioglu, Yiseul Yoo, Jung-Woo T. Seo, Julia R. Downing, Hee-Dae Lim, Michael J. Bedzyk, Elucidating and Mitigating High-Voltage Degradation Cascades in Cobalt-Free LiNiO2 Lithium-Ion Battery Cathodes, Advanced Materials, Volume 34, Issue 3, January 20, 2022, 2106402.
[22] Meaghan A. McCormack, Wayne E. McFee, Heidi R. Whitehead, Sarah Piwetz & Jessica Dutton, Exploring the Use of SEM–EDS Analysis to Measure the Distribution of Major, Minor, and Trace Elements in Bottlenose Dolphin (Tursiops truncatus) Teeth, Biological Trace Element Research volume 200, pages 2147–2159 (2022).
[23] Hirosuke Matsui, Shinobu Takao, Kotaro Higashi, Takuma Kaneko, Gabor Samjeské, Tomoya Uruga, Mizuki Tada, and Yasuhiro Iwasawa, perando Imaging of Ce Radical Scavengers in a Practical Polymer Electrolyte Fuel Cell by 3D Fluorescence CT–XAFS and Depth-Profiling Nano-XAFS–SEM/EDS Techniques, ACS Appl. Mater. Interfaces 2022, 14, 5, 6762–6776.
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  • APA Style

    Nam Chol Yu, Il Man Pak. (2022). Study on Accelerating Voltage of SEM in Observation of Carbon Nanotube Surface. Nanoscience and Nanometrology, 8(1), 10-14. https://doi.org/10.11648/j.nsnm.20220801.12

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    ACS Style

    Nam Chol Yu; Il Man Pak. Study on Accelerating Voltage of SEM in Observation of Carbon Nanotube Surface. Nanosci. Nanometrol. 2022, 8(1), 10-14. doi: 10.11648/j.nsnm.20220801.12

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    AMA Style

    Nam Chol Yu, Il Man Pak. Study on Accelerating Voltage of SEM in Observation of Carbon Nanotube Surface. Nanosci Nanometrol. 2022;8(1):10-14. doi: 10.11648/j.nsnm.20220801.12

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  • @article{10.11648/j.nsnm.20220801.12,
      author = {Nam Chol Yu and Il Man Pak},
      title = {Study on Accelerating Voltage of SEM in Observation of Carbon Nanotube Surface},
      journal = {Nanoscience and Nanometrology},
      volume = {8},
      number = {1},
      pages = {10-14},
      doi = {10.11648/j.nsnm.20220801.12},
      url = {https://doi.org/10.11648/j.nsnm.20220801.12},
      eprint = {https://article.sciencepublishinggroup.com/pdf/10.11648.j.nsnm.20220801.12},
      abstract = {Carbon nanotubes (CNTs) have attracted increasing attention due to their superior physical and chemical properties such as their high electrical and thermal conductivity, great specific area, etc. Scanning electron microscopy on commercial CNTs was optimized. Based of Rayleigh level, the resolution of optical system was induced by substituting parameters of thermoelectric emission scanning electron microscope. The size of interaction range of electron-CNTs is evaluated by substituting parameters of CNTs into the equation evaluating size of Kanaya-Okayama range. Based on theoretical analytical results, the high voltage range is defined in fine structure observation of CNTs surface by thermoelectric emission scanning electron microscope. We selected the spot size as 1.5nm, the working distance as 4.3mm, and did the SEM measurement experiment changing the accelerating voltage. The effects of energy of the incident electron on the size of the electron-CNTs interaction range and the resolution of SEM were theoretically investigated. As a result, in case of microstructure observation of CNTs surface by using thermoelectric SEM, the most proper accelerating voltage was within 5~10kV. Through the experiments based on it, we found that the accelerating voltage of 7.5kV enables us to get the sharpest image of the microstructure of CNT surface. Then we compared theoretical results and experimental results. Theoretical results and experimental results were agreed well.},
     year = {2022}
    }
    

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  • TY  - JOUR
    T1  - Study on Accelerating Voltage of SEM in Observation of Carbon Nanotube Surface
    AU  - Nam Chol Yu
    AU  - Il Man Pak
    Y1  - 2022/10/31
    PY  - 2022
    N1  - https://doi.org/10.11648/j.nsnm.20220801.12
    DO  - 10.11648/j.nsnm.20220801.12
    T2  - Nanoscience and Nanometrology
    JF  - Nanoscience and Nanometrology
    JO  - Nanoscience and Nanometrology
    SP  - 10
    EP  - 14
    PB  - Science Publishing Group
    SN  - 2472-3630
    UR  - https://doi.org/10.11648/j.nsnm.20220801.12
    AB  - Carbon nanotubes (CNTs) have attracted increasing attention due to their superior physical and chemical properties such as their high electrical and thermal conductivity, great specific area, etc. Scanning electron microscopy on commercial CNTs was optimized. Based of Rayleigh level, the resolution of optical system was induced by substituting parameters of thermoelectric emission scanning electron microscope. The size of interaction range of electron-CNTs is evaluated by substituting parameters of CNTs into the equation evaluating size of Kanaya-Okayama range. Based on theoretical analytical results, the high voltage range is defined in fine structure observation of CNTs surface by thermoelectric emission scanning electron microscope. We selected the spot size as 1.5nm, the working distance as 4.3mm, and did the SEM measurement experiment changing the accelerating voltage. The effects of energy of the incident electron on the size of the electron-CNTs interaction range and the resolution of SEM were theoretically investigated. As a result, in case of microstructure observation of CNTs surface by using thermoelectric SEM, the most proper accelerating voltage was within 5~10kV. Through the experiments based on it, we found that the accelerating voltage of 7.5kV enables us to get the sharpest image of the microstructure of CNT surface. Then we compared theoretical results and experimental results. Theoretical results and experimental results were agreed well.
    VL  - 8
    IS  - 1
    ER  - 

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Author Information
  • School of Science and Engineering, Kim Chaek University of Technology, Pyongyang, Democratic People’s Republic of Korea

  • Analytical Institute, Kim Chaek University of Technology, Pyongyang, Democratic People’s Republic of Korea

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